Nano Home

NANOlab Center of Excellence literature database

Home |  Show All |  Simple Search |  Advanced Search
Quick Search:
1–1 of 1 record found matching your query (RSS | history):
toggle visibility
Search within Results:
Display Options:
Number of records found: 1
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
Callaert C (2020) Characterization of defects, modulations and surface layers in topological insulators and structurally related compounds. 180 p
toggle visibility
url
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
toggle visibility
Save Citations:
Export Records:
Home CQL Search  |  Library Search  |  Show Record  |  Extract Citations Help