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	“TEM annular objective apertures fabricated by FIB”. Bals S, Radmilovic V, Kisielowski C, Microscopy and microanalysis 10, 1148 (2004). http://doi.org/10.1017/S1431927604881765 Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 1.891 DOI: 10.1017/S1431927604881765 Additional Links: UA library record Permanent link \| Save citation: RTF PDF LaTeX \| Export record: BibTeX Endnote ISI RIS Word XML

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