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Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields”. Adriaensen L, Vangaever F, Gijbels R, Analytical chemistry 76, 6777 (2004). http://doi.org/10.1021/ac049108d
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A comparative study of carbocyanine dyes measured with TOF-SIMS and other mass spectrometric techniques”. Adriaensen L, Vangaever F, Gijbels R, Applied surface science 231/232, 348 (2004). http://doi.org/10.1016/j.apsusc.2004.03.091
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Organic SIMS: the influence of time on the ion yield enhancement by silver and gold deposition”. Adriaensen L, Vangaever F, Gijbels R, Applied surface science 231/232, 256 (2004). http://doi.org/10.1016/j.apsusc.2004.03.031
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Organische TOF-S-SIMS: gebruik van opgedampt Ag en Au voor de verhoging van secundaire ionenintensiteiten”. Adriaensen L, Vangaever F, Gijbels R, Chemie magazine , 10 (2004)
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