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Author Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A. pdf  openurl
  Title Study of ramp-type Josephson junctions by HREM Type A1 Journal article
  Year (down) 1997 Publication Electronic Applications; Vol 2: Large Scale And Power Applications Abbreviated Journal  
  Volume Issue 158 Pages 49-52  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-delta high-T-c superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-delta. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties.  
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  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000071955200012 Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0-7503-0487-1 ISBN Additional Links UA library record; WoS full record;  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:102941 Serial 3333  
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