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Author Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D. url  doi
openurl 
  Title Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range Type A1 Journal article
  Year (down) 2006 Publication Physical review letters Abbreviated Journal Phys Rev Lett  
  Volume 96 Issue 9 Pages 096106,1-4  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract The local structure of Bi4W2/3Mn1/3O8Cl is determined using quantitative transmission electron microscopy. The electron exit wave, which is closely related to the projected crystal potential, is reconstructed and used as a starting point for statistical parameter estimation. This method allows us to refine all atomic positions on a local scale, including those of the light atoms, with a precision in the picometer range. Using this method one is no longer restricted to the information limit of the electron microscope. Our results are in good agreement with x-ray powder diffraction data demonstrating the reliability of the method. Moreover, it will be shown that local effects can be interpreted using this approach.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos 000235905700042 Publication Date 2006-03-10  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0031-9007;1079-7114; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 8.462 Times cited 69 Open Access  
  Notes Fwo; Iap V Approved Most recent IF: 8.462; 2006 IF: 7.072  
  Call Number UA @ lucian @ c:irua:56977 Serial 3154  
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