| Do, M.T.; Gauquelin, N.; Nguyen, M.D.; Blom, F.; Verbeeck, J.; Koster, G.; Houwman, E.P.; Rijnders, G. |
Interface degradation and field screening mechanism behind bipolar-cycling fatigue in ferroelectric capacitors |
2021 |
Apl Materials |
9 |
5 |
UA library record; WoS full record; WoS citing articles |
