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Title
Year
Publication
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Lumbeeck, G.
;
Delvaux, A.
;
Idrissi, H.
;
Proost, J.
;
Schryvers, D.
Analysis of internal stress build-up during deposition of nanocrystalline Ni thin films using transmission electron microscopy
2020
Thin solid films : an international journal on the science and technology of thin and thick films
707
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