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Title
Year
Publication
Volume
Times cited
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Gonnissen, J.
;
De Backer, A.
;
den Dekker, A.J.
;
Sijbers, J.
;
Van Aert, S.
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – that's the question
2016
Ultramicroscopy
174
2
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