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Author Title Year (down) Publication Volume Times cited Additional Links
Van Dyck, P.; Markowicz, A.; Van Grieken, R. Influence of sample thickness, excitation energy and geometry on particle size effects in XRF 1985 X-ray spectrometry 14 UA library record; WoS full record; WoS citing articles
Van Dyck, P.; Markowicz, A.; Van Grieken, R. Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal 1980 X-ray spectrometry 9 UA library record; WoS full record; WoS citing articles