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Author
Title
Year
Publication
Volume
Times cited
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Goessens, C.
;
Schryvers, D.
;
van Landuyt, J.
;
Amelinckx, S.
;
Geuens, I.
;
Gijbels, R.
;
Jacob, W.
;
Verbeeck, A.
;
de Keyzer, R.
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging
1991
UA library record
