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Godoi, R.H.M.
;
Potgieter-Vermaak, S.
;
de Hoog, J.
;
Kaegi, R.
;
Van Grieken, R.
Substrate selection for optimum qualitative and quantitative single atmospheric particles analysis using nano-manipulation, sequential thin-window electron probe X-ray microanalysis and micro-Raman spectrometry
2006
Spectrochimica acta: part B : atomic spectroscopy
61
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