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Author
Title
Year
Publication
Volume
Times cited
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Geuens, P.
;
Lebedev, O.I.
;
van Dyck, D.
;
Van Tendeloo, G.
Accurate measurements of atomic displacements in La
0.9
Sr
0.1
MnO
3
thin films grown on a SrTiO
3
substrate
2000
UA library record
