Home << 1 >>
List View
 | 
Citations
 | 
Details
   web
Author Title Year (down) Publication Volume Times cited Additional Links
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate 1996 Applied surface science 102 9 UA library record; WoS full record; WoS citing articles
Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. Structural characterisation of erbium silicide thin films of an Si(111) substrate 1996 Journal of alloys and compounds 234 14 UA library record; WoS full record; WoS citing articles