| Felten, A.; Gillon, X.; Gulas, M.; Pireaux, J.-J.; Ke, X.; Van Tendeloo, G.; Bittencourt, C.; Najafi, E.; Hitchcock, A.P. |
Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy |
2010 |
ACS nano |
4 |
26 |
UA library record; WoS full record; WoS citing articles |
