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Title
Year
Publication
Volume
Times cited
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De wael, A.
;
De Backer, A.
;
Jones, L.
;
Varambhia, A.
;
Nellist, P.D.
;
Van Aert, S.
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy
2020
Physical Review Letters
124
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;
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;
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