NANOlab Center of Excellence literature database -- Query Results

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Author	Title	Year	Publication	Volume	Times cited	Additional Links
De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S.	Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?	2015	Journal of physics : conference series	644		UA library record; WoS full record
de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S.	Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits?	2015	Journal of physics : conference series	644		UA library record