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Author
Title
Year
Publication
Volume
Times cited
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Cao, S.
;
Somsen, C.
;
Croitoru, M.
;
Schryvers, D.
;
Eggeler, G.
Focused ion beam/scanning electron microscopy tomography and conventional transmission electron microscopy assessment of Ni
4
Ti
3
morphology in compression-aged Ni-rich Ni-Ti single crystals
2010
Scripta materialia
62
16
UA library record
;
WoS full record
;
WoS citing articles
