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Author
Title
Year
Publication
Volume
Times cited
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Bittencourt, C.
;
Hitchock, A.P.
;
Ke, X.
;
Van Tendeloo, G.
;
Ewels, C.P.
;
Guttmann, P.
X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge
2012
Beilstein journal of nanotechnology
3
15
UA library record
;
WoS full record
;
WoS citing articles
