NANOlab Center of Excellence literature database -- Query Results

“Measurement of specimen thickness by phase change determination in TEM”. Croitoru MD, van Dyck D, Liu YZ, Zhang Z, Ultramicroscopy 108, 1616 (2008). http://doi.org/10.1016/j.ultramic.2008.06.002 Abstract: A non-destructive method for measuring the thickness of thin amorphous films composed of light elements has been developed. The method employs the statistics of the phase of the electron exit wave function. The accuracy of this method has been checked numerically by the multislice method and compared with that based on the mean inner potential. Keywords: A1 Journal article; Condensed Matter Theory (CMT); Electron microscopy for materials research (EMAT); Vision lab Impact Factor: 2.843 Times cited: 2 DOI: 10.1016/j.ultramic.2008.06.002 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=1961

Abstract: A non-destructive method for measuring the thickness of thin amorphous films composed of light elements has been developed. The method employs the statistics of the phase of the electron exit wave function. The accuracy of this method has been checked numerically by the multislice method and compared with that based on the mean inner potential.

Keywords: A1 Journal article; Condensed Matter Theory (CMT); Electron microscopy for materials research (EMAT); Vision lab

Impact Factor: 2.843

Times cited: 2

DOI: 10.1016/j.ultramic.2008.06.002

Additional Links: UA library record; WoS full record; WoS citing articles

show.php?record=1961