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| Author | Frangis, N.; Van Tendeloo, G.; van Landuyt, J.; Muret, P.; Nguyen, T.T.A. | ||||
| Title | Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate | Type | A1 Journal article | ||
Year  |
1996 | Publication | Applied surface science | Abbreviated Journal | Appl Surf Sci |
| Volume | 102 | Issue | Pages | 163-168 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | A1996VJ86100037 | Publication Date | 2003-05-12 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0169-4332; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.711 | Times cited | 9 | Open Access | |
| Notes | Approved | no | |||
| Call Number | UA @ lucian @ c:irua:15458 | Serial | 953 | ||
| Permanent link to this record | |||||