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| Author | Kirilenko, D.A. | ||||
| Title | Electron diffraction measurement of the binding rigidity of free-standing graphene | Type | A1 Journal article | ||
Year  |
2013 | Publication | Technical physics letters | Abbreviated Journal | Tech Phys Lett+ |
| Volume | 39 | Issue | 4 | Pages | 325-328 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | A method for measuring the binding rigidity of free-standing graphene from the dependence of the short-wavelength spectral range of transverse structural fluctuations of a crystal is proposed. The fluctuation spectrum is measured according to the variation in electron-diffraction patterns derived in a transmission electron microscope while tilting the sample. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000319162600003 | Publication Date | 2013-05-16 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1063-7850;1090-6533; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 0.771 | Times cited | 3 | Open Access | |
| Notes | Approved | Most recent IF: 0.771; 2013 IF: 0.583 | |||
| Call Number | UA @ lucian @ c:irua:109031 | Serial | 920 | ||
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