| Record |
| Author |
Jones, K.W.; Feng, H.; Lindquist, W.B.; Adler, P.M.; Thover, J.F.; Vekemans, B.; Vincze, L.; Szalóki, I.; Van Grieken, R.; Adams, F.; Riekel, C. |
| Title |
Study of microgeometry of porous materials using synchrotron computed microtomography |
Type |
H3 Book chapter |
Year  |
2003 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
39-49
T2 - Applications of X-ray computed tomograp |
| Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Thesis |
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Place of Publication |
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Editor |
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Wos |
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Publication Date |
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Series Title |
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ISBN |
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Additional Links |
UA library record |
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Times cited |
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Open Access |
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| Notes |
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Approved |
no |
| Call Number |
UA @ admin @ c:irua:41596 |
Serial |
8602 |
| Permanent link to this record |
