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| Record | |||||
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| Author | Markowicz, A.M.; Van Grieken, R.E. | ||||
| Title | Quantification in XRF analysis of intermediate-thickness samples | Type | H3 Book chapter | ||
Year  |
1992 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 339-358 T2 - Handbook of X-ray spectroscopy / Grie | ||
| Keywords | H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | Publication Date | |||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:2855 | Serial | 8434 | ||
| Permanent link to this record | |||||