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| Author | Van Dyck, P.; Markowicz, A.; Van Grieken, R. | ||||
| Title | Influence of sample thickness, excitation energy and geometry on particle size effects in XRF | Type | A1 Journal article | ||
Year  |
1985 | Publication | X-ray spectrometry | Abbreviated Journal | |
| Volume | 14 | Issue | 4 | Pages | 183-187 |
| Keywords | A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | Expressions are presented for calculating the matrix effect and the pure particle size effect in the XRF analysis of particulate samples with a discrete particle size. The equations are based on the absorption-weighted radiometric diameter concept. Two excitationdetection geometries are considered, with the angles between the sample plane and both the incident and emerging radiation being either 90° (π geometry) or 45° (π/2 geometry). Calculations were made for different sample loadings and exciting radiation energies. The influence of these parameters on the matrix and pure particle size effects is shown. From the results, it is possible to predict the performances of alternative experimental correction procedures for the particle size effect, involving dual measurements at different excitation energies or in different excitationdetection geometries. | ||||
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| Publisher | Place of Publication | Editor | |||
| Language | Wos | A1985ATB6100007 | Publication Date | 2005-05-28 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0049-8246 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:116486 | Serial | 8097 | ||
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