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| Record | |||||
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| Author | Markowicz, A.; Raeymaekers, B.; Van Grieken, R.; Adams, F. | ||||
| Title | Analytical electron microscopy of single particles | Type | H3 Book chapter | ||
Year  |
1986 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 173-197 T2 - Physical and chemical characterizatio | ||
| Keywords | H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | Publication Date | |||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:117504 | Serial | 7455 | ||
| Permanent link to this record | |||||