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| Record | |||||
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| Author | Kruse, P.; Schowalter, M.; Lamoen, D.; Rosenauer, A.; Gerthsen, D. | ||||
| Title | Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography | Type | A1 Journal article | ||
Year  |
2006 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 106 | Issue | 2 | Pages | 105-113 |
| Keywords | A1 Journal article; Electron Microscopy for Materials Science (EMAT); | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000234535900005 | Publication Date | 2005-07-29 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 50 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2006 IF: 1.706 | |||
| Call Number | UA @ lucian @ c:irua:56143 | Serial | 678 | ||
| Permanent link to this record | |||||