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| Record | |||||
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| Author | Haller, M.; Radtke, M.; Knöchel, A.; Clöck, W.; Sutton, S.; Janssens, K.; Vincze, L. | ||||
| Title | Quantification of SY-XRF measurements at the X-ray microprobe | Type | A3 Journal article | ||
Year  |
1996 | Publication | HASYLAB Jahresbericht | Abbreviated Journal | |
| Volume | Issue | Pages | 956-957 | ||
| Keywords | A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | Publication Date | |||
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| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:21745 | Serial | 5792 | ||
| Permanent link to this record | |||||