| Record |
| Author |
Kempenaers, L.; Janssens, K.; Jochum, K.P.; Vincze, L.; Vekemans, B.; Somogyi, A.; Drakopoulos, M.; Adams, F. |
| Title |
Micro-heterogeneity study of trace elements in USGS, MPI-DING and glass reference materials by means of synchrotron micro-XRF |
Type |
A1 Journal article |
Year  |
2003 |
Publication |
Journal of analytical atomic spectrometry |
Abbreviated Journal |
J Anal Atom Spectrom |
| Volume |
18 |
Issue |
|
Pages |
350-357 |
| Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
| Abstract |
|
| Address |
|
| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
|
Editor |
|
| Language |
|
Wos |
000181827800010 |
Publication Date |
2003-03-27 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0267-9477 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
3.379 |
Times cited |
38 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 3.379; 2003 IF: 3.200 |
| Call Number |
UA @ admin @ c:irua:41009 |
Serial |
5715 |
| Permanent link to this record |
