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| Author | Alfeld, M.; Vekemans, B.; Janssens, K.; Falkenberg, G.; Broekaert, J.A.C.; Gao, N.; Gibson, D. | ||||
| Title | Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison | Type | H3 Book chapter | ||
Year  |
2007 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | |||
| Keywords | H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
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| Language | Wos | Publication Date | |||
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| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ admin @ c:irua:64598 | Serial | 5572 | ||
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