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| Record | |||||
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| Author | Janssens, K.; van Langevelde, F.; Adams, F.; Vis, R.; Sutton, S.; Rivers, M.; Jones, K.; Bowen, D. | ||||
| Title | Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis | Type | P3 Proceeding | ||
Year  |
1992 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | |||
| Keywords | P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | Publication Date | |||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:4190 | Serial | 5531 | ||
| Permanent link to this record | |||||