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| Author | de Nolf, W.; Jaroszewicz, J.; van der Snickt, G.; Janssens, K.; Farnell, S.; Klaassen, L. | ||||
| Title | Combined micro-XRF/XRPD tomography on historical and modern paint multilayer samples at Beamline L | Type | H3 Book chapter | ||
Year  |
2008 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 1633-1634 | ||
| Keywords | H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
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| Publisher | Place of Publication | Editor | |||
| Language | Wos | Publication Date | |||
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| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ admin @ c:irua:74475 | Serial | 5522 | ||
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