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| Record | |||||
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| Author | Jacques, P.; Verbist, K.; Lapin, J.; Ryelandt, L.; Van Tendeloo, G.; Delannay, F. | ||||
| Title | Critical assessment of the process of growth of a YBa2Cu3O7-\delta layer on Y2BaCuO5 | Type | A1 Journal article | ||
Year  |
1996 | Publication | Superconductor science and technology | Abbreviated Journal | Supercond Sci Tech |
| Volume | 9 | Issue | Pages | 176-183 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Bristol | Editor | ||
| Language | Wos | A1996TZ48100008 | Publication Date | 2002-08-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0953-2048;1361-6668; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.325 | Times cited | 1 | Open Access | |
| Notes | Approved | no | |||
| Call Number | UA @ lucian @ c:irua:15462 | Serial | 539 | ||
| Permanent link to this record | |||||