| Home | << 1 >> |
|
| Record | |||||
|---|---|---|---|---|---|
| Author | Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. | ||||
| Title | High resolution electron microscopy from imaging towards measuring | Type | H2 Book chapter | ||
Year  |
2001 | Publication | ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 | Abbreviated Journal | |
| Volume | Issue | Pages | 2081-2086 | ||
| Keywords | H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Ieee | Place of Publication | Editor | ||
| Language | Wos | Publication Date | 2002-11-13 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | 0-7803-6646-8 | Additional Links | UA library record | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:136870 | Serial | 4501 | ||
| Permanent link to this record | |||||