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| Record | |||||
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| Author | Vasiliev, A.L.; Van Tendeloo, G.; Amelinckx, S.; Boikov, Y.; Olsson, E.; Ivanov, Z. | ||||
| Title | Structural aspect of YBa2Cu3O7-x films on Sis with complex barrier layers | Type | A1 Journal article | ||
Year  |
1995 | Publication | Physica: C : superconductivity | Abbreviated Journal | Physica C |
| Volume | 244 | Issue | Pages | 373-388 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | A1995QQ29300025 | Publication Date | 2003-04-05 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0921-4534; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 0.942 | Times cited | 28 | Open Access | |
| Notes | Approved | ||||
| Call Number | UA @ lucian @ c:irua:13312 | Serial | 3203 | ||
| Permanent link to this record | |||||