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| Record | |||||
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| Author | van Dyck, D.; Van Aert, S.; den Dekker, A.J. | ||||
| Title | Physical limits on atomic resolution | Type | A1 Journal article | ||
Year  |
2004 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 10 | Issue | Pages | 153-157 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | 000188882100022 | Publication Date | 2004-08-11 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.891 | Times cited | 14 | Open Access | |
| Notes | Approved | Most recent IF: 1.891; 2004 IF: 2.389 | |||
| Call Number | UA @ lucian @ c:irua:47515 | Serial | 2616 | ||
| Permanent link to this record | |||||