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| Record | |||||
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| Author | Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. | ||||
| Title | New method to determine the parity of the number of twin planes in tabular silver halide microcrystals from top views | Type | A1 Journal article | ||
Year  |
1997 | Publication | The journal of imaging science and technology | Abbreviated Journal | J Imaging Sci Techn |
| Volume | 41 | Issue | Pages | 301-307 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Springfield, Va | Editor | ||
| Language | Wos | 000077457600017 | Publication Date | 0000-00-00 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1062-3701 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 0.348 | Times cited | 1 | Open Access | |
| Notes | Approved | Most recent IF: 0.348; 1997 IF: NA | |||
| Call Number | UA @ lucian @ c:irua:21346 | Serial | 2324 | ||
| Permanent link to this record | |||||