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| Record | |||||
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| Author | Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. | ||||
| Title | New intermediate defect configuration in Si studied by in situ HREM irradiation | Type | A1 Journal article | ||
Year  |
1997 | Publication | Conference series of the Institute of Physics | Abbreviated Journal | |
| Volume | 157 | Issue | Pages | 43-46 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | London | Editor | ||
| Language | Wos | 000071954600006 | Publication Date | 0000-00-00 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0305-2346 | ISBN | Additional Links | UA library record; WoS full record; | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:21428 | Serial | 2318 | ||
| Permanent link to this record | |||||