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| Record | |||||
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| Author | Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, S. | ||||
| Title | Microstructure of YBa2Cu3O7-x films on buffered Si for microelectronic applications | Type | A1 Journal article | ||
Year  |
1997 | Publication | Superconductor science and technology | Abbreviated Journal | Supercond Sci Tech |
| Volume | 10 | Issue | Pages | 356-365 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Bristol | Editor | ||
| Language | Wos | A1997WY69100015 | Publication Date | 0000-00-00 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0953-2048 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.878 | Times cited | 2 | Open Access | |
| Notes | Approved | Most recent IF: 2.878; 1997 IF: 2.183 | |||
| Call Number | UA @ lucian @ c:irua:21434 | Serial | 2076 | ||
| Permanent link to this record | |||||