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| Author | Mahieu, S.; Ghekiere, P.; de Winter, G.; Heirwegh, S.; Depla, D.; de Gryse, R.; Lebedev, O.I.; Van Tendeloo, G. | ||||
| Title | Mechanism of preferential orientation in sputter deposited titanium nitride and yttria-stabilized zirconia layers | Type | A1 Journal article | ||
Year  |
2005 | Publication | Journal of crystal growth | Abbreviated Journal | J Cryst Growth |
| Volume | 279 | Issue | Pages | 100-109 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000229348400015 | Publication Date | 2005-03-19 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0022-0248; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.751 | Times cited | 41 | Open Access | |
| Notes | Approved | Most recent IF: 1.751; 2005 IF: 1.681 | |||
| Call Number | UA @ lucian @ c:irua:54788 | Serial | 1979 | ||
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