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| Record | |||||
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| Author | Potapov, P.L.; Schryvers, D. | ||||
| Title | Measuring the absolute position of EELS ionisation edges in a TEM | Type | A1 Journal article | ||
Year  |
2004 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 99 | Issue | Pages | 73-85 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000220804700005 | Publication Date | 2003-08-12 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 29 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2004 IF: 2.215 | |||
| Call Number | UA @ lucian @ c:irua:48781 | Serial | 1970 | ||
| Permanent link to this record | |||||