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| Author | Ke, X.; Bittencourt, C.; Bals, S.; Van Tendeloo, G. | ||||
| Title | Low-dose patterning of platinum nanoclusters on carbon nanotubes by focused-electron-beam-induced deposition as studied by TEM | Type | A1 Journal article | ||
Year  |
2013 | Publication | Beilstein journal of nanotechnology | Abbreviated Journal | Beilstein J Nanotech |
| Volume | 4 | Issue | Pages | 77-86 | |
| Keywords | A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Focused-electron-beam-induced deposition (FEBID) is used as a direct-write approach to decorate ultrasmall Pt nanoclusters on carbon nanotubes at selected sites in a straightforward maskless manner. The as-deposited nanostructures are studied by transmission electron microscopy (TEM) in 2D and 3D, demonstrating that the Pt nanoclusters are well-dispersed, covering the selected areas of the CNT surface completely. The ability of FEBID to graft nanoclusters on multiple sides, through an electron-transparent target within one step, is unique as a physical deposition method. Using high-resolution TEM we have shown that the CNT structure can be well preserved thanks to the low dose used in FEBID. By tuning the electron-beam parameters, the density and distribution of the nanoclusters can be controlled. The purity of as-deposited nanoclusters can be improved by low-energy electron irradiation at room temperature. | ||||
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| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000314499700001 | Publication Date | 2013-02-04 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 2190-4286; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 3.127 | Times cited | 12 | Open Access | |
| Notes | 262348 ESMI; 246791 COUNTATOMS; FWO G002410N; ESF Cost Action NanoTP MP0901 | Approved | Most recent IF: 3.127; 2013 IF: 2.332 | ||
| Call Number | UA @ lucian @ c:irua:106187 | Serial | 1848 | ||
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