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| Record | |||||
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| Author | van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. | ||||
| Title | Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? | Type | A1 Journal article | ||
Year  |
2003 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 98 | Issue | Pages | 27-42 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000186831500003 | Publication Date | 2003-04-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 26 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2003 IF: 1.665 | |||
| Call Number | UA @ lucian @ c:irua:47516 | Serial | 1749 | ||
| Permanent link to this record | |||||