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| Record | |||||
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| Author | Vanhellemont, J.; Claeys, C.; van Landuyt, J. | ||||
| Title | In-situ HVEM study of dislocation generation in patterned stress fields at silicon surfaces | Type | A1 Journal article | ||
Year  |
1995 | Publication | Physica status solidi: A: applied research | Abbreviated Journal | |
| Volume | 150 | Issue | Pages | 497-506 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Berlin | Editor | ||
| Language | Wos | A1995RQ21500043 | Publication Date | 2007-01-12 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0031-8965;1521-396X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | 6 | Open Access | ||
| Notes | Approved | no | |||
| Call Number | UA @ lucian @ c:irua:13293 | Serial | 1582 | ||
| Permanent link to this record | |||||