| Home | << 1 >> |
|
| Record | |||||
|---|---|---|---|---|---|
| Author | Van Aert, S.; den Dekker, A.J.; van Dyck, D. | ||||
| Title | How to optimize the experimental design of quantitative atomic resolution TEM experiments? | Type | A1 Journal article | ||
Year  |
2004 | Publication | Micron | Abbreviated Journal | Micron |
| Volume | 35 | Issue | Pages | 425-429 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000221721000005 | Publication Date | 2004-03-06 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.98 | Times cited | 14 | Open Access | |
| Notes | Approved | Most recent IF: 1.98; 2004 IF: 1.464 | |||
| Call Number | UA @ lucian @ c:irua:47514 | Serial | 1495 | ||
| Permanent link to this record | |||||