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| Record | |||||
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| Author | Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. | ||||
| Title | High-resolution electron microscopy and electron tomography: resolution versus precision | Type | A1 Journal article | ||
Year  |
2002 | Publication | Journal of structural biology | Abbreviated Journal | J Struct Biol |
| Volume | 138 | Issue | Pages | 21-33 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | New York | Editor | ||
| Language | Wos | 000177978800003 | Publication Date | 2002-09-17 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1047-8477; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.767 | Times cited | 33 | Open Access | |
| Notes | Approved | Most recent IF: 2.767; 2002 IF: 4.194 | |||
| Call Number | UA @ lucian @ c:irua:47520 | Serial | 1446 | ||
| Permanent link to this record | |||||