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“Virtual underpainting reconstruction from X-ray fluorescence imaging data”. Anitha A, Brasoveanu A, Duarte MF, Hughes SM, Daubechies I, Dik J, Janssens K, Alfeld M, , 1239 (2011)
Keywords: P1 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“The use of full-field XRF for simultaneous elemental mapping”. Alfeld M, Janssens K, Sasov A, Liu X, Kostenko A, Rickers-Appel K, Falkenberg G, , 111 (2010). http://doi.org/10.1063/1.3399236
Abstract: The characteristics of a Full-Field X-ray Fluorescence (FF-XRF) set-up for element-specific imaging, installed at the HASYLAB synchrotron radiation source, were determined. A lateral resolution of 10 μm and limits of detection in the percentage range were found. Further potential developments in CCDs available for FF-XRF are discussed and the use of polycapillary lenses as image transfer optics is illustrated in some explorative experiments.
Keywords: P1 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Times cited: 8
DOI: 10.1063/1.3399236
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“James Ensor's pigment use: artistic and material evolution studied by means of portable X-ray fluorescence spectrometry”. van der Snickt G, Janssens K, Schalm O, Aibéo C, Kloust H, Alfeld M, X-ray spectrometry 39, 103 (2010). http://doi.org/10.1002/XRS.1235
Abstract: In this paper, portable X-ray fluorescence spectrometry (PXRF) was employed as a screening tool for determining and comparing the pigment use in a large series of paintings by the Belgian artist James Ensor (1860-1949). Benefits and drawbacks of PXRF as a method, and the instrument employed, are discussed from a practical, conservation and instrumental perspective. Regardless of several restrictions due to the set-up and/or the analytical method, it appeared feasible to document the evolution with time in Ensor's use of inorganic pigments and to correlate this technical evolution with stylistic developments, Nevertheless, it became clear that a full identification of all materials present can only be done by means of the analysis of (cross-sectioned) samples.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 25
DOI: 10.1002/XRS.1235
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“Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison”. Alfeld M, Vekemans B, Janssens K, Falkenberg G, Broekaert JAC, Gao N, Gibson D (2007).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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