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“Extension of the clathrate family : the type X clathrate Ge79P29S18Te6”. Kirsanova MA, Olenev AV, Abakumov AM, Bykov MA, Shevelkov AV, Angewandte Chemie: international edition in English 50, 2371 (2011). http://doi.org/10.1002/anie.201007483
Abstract: Now they are 10! The title compound displays a new type of crystal structure and is labeled clathrate X according to the general classification of clathrate structures. In contrast to typical clathrates, this compound has three-coordinate atoms within the framework and combines distorted 24-vertex polyhedra (see picture, green) centered around tellurium guest atoms with very irregular 10-vertex polyhedra around sulfur atoms (yellow).
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 11.994
Times cited: 23
DOI: 10.1002/anie.201007483
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“Unit-cell-level assembly of metastable transition-metal oxides by pulsed-laser deposition”. Yan L, Niu H, Bridges CA, Marshall PA, Hadermann J, Van Tendeloo G, Chalker PR, Rosseinsky MJ, Angewandte Chemie: international edition in English 46, 4539 (2007). http://doi.org/10.1002/anie.200700119
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 11.994
Times cited: 16
DOI: 10.1002/anie.200700119
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“Crystallographic shear structures as a route to anion-deficient perovskites”. Abakumov AM, Hadermann J, Bals S, Nikolaev IV, Antipov EV, Van Tendeloo G, Angewandte Chemie: international edition in English 45, 6697 (2006). http://doi.org/10.1002/anie.200602480
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 11.994
Times cited: 62
DOI: 10.1002/anie.200602480
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“Catalytic carbon oxidation over ruthenium-based catalysts”. Villani K, Kirschhock CEA, Liang D, Van Tendeloo G, Martens JA, Angewandte Chemie: international edition in English 45, 3106 (2006). http://doi.org/10.1002/anie.200503799
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 11.994
Times cited: 36
DOI: 10.1002/anie.200503799
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Kirschhock CEA, Liang D, Aerts A, Aerts CA, Kremer SPB, Jacobs PA, Van Tendeloo G, Martens JA (2004) On the TEM and AFM evidence of zeosil nanoslabs present during the synthesis of silicalite-1 : reply. Weinheim, 4562–4564
Keywords: L1 Letter to the editor; Electron microscopy for materials research (EMAT)
Impact Factor: 11.994
DOI: 10.1002/anie.200460541
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