| Records |
| Author |
Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. |
| Title |
The study of high Tc-superconducting materials by electron microscopy and electron diffraction |
Type |
A1 Journal article |
Year  |
1991 |
Publication |
Superconductor science and technology
T2 – SATELLITE CONF TO THE 19TH INTERNATIONAL CONF ON LOW TEMPERATURE PHYSICS : HIGH TEMPERATURE SUPERCONDUCTIVITY, AUG 13-15, 1990, QUEENS COLL, CAMBRIDGE, ENGLAND |
Abbreviated Journal |
Supercond Sci Tech |
| Volume |
4 |
Issue |
s:[1] |
Pages |
S19-S34 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
A survey is given of the application of different electron microscopic techniques to the study of structural features of high T(c)-superconducting materials. Emphasis is laid in this contribution on those structural aspects for the study of which electron microscopy has been essential or has contributed to a significant extent. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
Bristol |
Editor |
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| Language |
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Wos |
A1991FA42000004 |
Publication Date |
2002-08-25 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
0953-2048;1361-6668; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.325 |
Times cited |
2 |
Open Access |
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| Notes |
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Approved |
PHYSICS, APPLIED 47/145 Q2 # |
| Call Number |
UA @ lucian @ c:irua:104503 |
Serial |
3596 |
| Permanent link to this record |
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| Author |
Van Tendeloo, G.; Schryvers, D.; Tanner, L.E.; Broddin, D.; Ricolleau, C.; Loiseau, A. |
| Title |
Structural phase transformations in alloys: an electron microscopy study |
Type |
P3 Proceeding |
| Year |
1991 |
Publication |
Symposium on Pahse Transformations |
Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
1-10 |
| Keywords |
P3 Proceeding; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
0000-00-00 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
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| Call Number |
UA @ lucian @ c:irua:48350 |
Serial |
3244 |
| Permanent link to this record |
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| Author |
Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J. |
| Title |
Electron microscopy of interfaces in new materials |
Type |
H3 Book chapter |
| Year |
1991 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
200-209 |
| Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
s.l. |
Editor |
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| Language |
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Wos |
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Publication Date |
0000-00-00 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
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ISBN |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
no |
| Call Number |
UA @ lucian @ c:irua:48353 |
Serial |
962 |
| Permanent link to this record |
