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	“High-resolution electron microscopy : from imaging toward measuring”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D, IEEE transactions on instrumentation and measurement 51, 611 (2002). http://doi.org/10.1109/TIM.2002.802250 Keywords: A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab Impact Factor: 2.456 Times cited: 13 DOI: 10.1109/TIM.2002.802250 Additional Links: UA library record; WoS full record; WoS citing articles Permanent link \| Save citation: RTF PDF LaTeX \| Export record: BibTeX Endnote ISI RIS Word XML

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