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Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles”. Storms HM, Janssens KH, Török SB, Van Grieken RE, X-ray spectrometry 18, 45 (1989). http://doi.org/10.1002/XRS.1300180203
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Absorption correction in electron probe x-ray microanalysis of thin samples”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 58, 1282 (1986). http://doi.org/10.1021/AC00298A003
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Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 57, 2885 (1985). http://doi.org/10.1021/AC00291A032
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